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Centralized Facilities
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Powder X-ray Diffractometer (XRD)
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SEM equipped with EDS & FESEM with WDS
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Simultaneous Thermal Analysis (STA)
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X-ray Photoelectron Spectroscopy (XPS)
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Thin-film preparation through sputtering, E-beam
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Thermal conductivity instruments
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Electron Probe Microanalysis (EPMA)
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Raman Microscopy
Facilities in Group
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U.V.-Visible-NIR Spectrophotometer
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FTIR Spectrometer
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Muffle Furnace / Tubular Furnace
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Optical Microscope
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Potentiostat
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Microwave Oven and Vaccum Oven
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Brunauer-Emmett-Teller (BET)​
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